Title :
Process variation aware ESD design window considerations on a 0.18μm analog, mixed-signal high voltage technology
Author :
Roger, Frederic ; Reinprecht, Wolfgang ; Minixhofer, Rainer
Author_Institution :
Austriamicrosystems, Schloss Premstatten, Austria
Abstract :
The boundary conditions leading to the “ESD Design Window” like the trigger diode characteristics, process variability, parameters drift because of low temperature, and voltage drop of the ESD circuit elements (forward diode, central clamp, bus resistance) are investigated and put into context. A 0.18μm High Voltage Technology is analyzed with respect to these constraints.
Keywords :
electrostatic discharge; mixed analogue-digital integrated circuits; power integrated circuits; ESD circuit elements; analog signal high voltage technology; bus resistance; central clamp; forward diode; mixed-signal high voltage technology; process variability; process variation aware ESD design window; size 0.18 mum; trigger diode characteristics; voltage drop; Clamps; Doping; Electrostatic discharge; Junctions; Resistance; Semiconductor diodes;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
