Title :
Report on Committee to Promote National Microwave Standards
Author_Institution :
Hewlett-Packard, Santa Rosa, CA
Keywords :
Atrophy; Calibration; Connectors; Government; Laboratories; Metrology; Microwave technology; NIST; Paper technology; Retirement;
Conference_Titel :
ARFTG Conference Digest-Spring, 25th ARFTG
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1985.323619
