Title :
Frequency- and Phase-Tunable Optoelectronic Oscillator
Author :
Liang Gao ; Muguang Wang ; Xiangfei Chen ; Jianping Yao
Author_Institution :
Microwave Photonics Res. Lab., Univ. of Ottawa, Ottawa, ON, Canada
Abstract :
An optoelectronic oscillator (OEO) for the generation of a microwave signal with both tunable frequency and phase is proposed and experimentally demonstrated. In the proposed OEO, a single-sideband (SSB) polarization-modulated signal is generated by a polarization modulator (PolM) and a phase-shifted fiber Bragg grating (PS-FBG). The SSB polarization-modulated signal is then split into two parts. One part is sent to a photodetector (PD) and then fed back to the PolM to form the OEO loop. The other part is sent to an electronically tunable polarizer (ETP) and then applied to a second PD. The frequency tunability is achieved by tuning the wavelength of the optical carrier. The tunable phase is introduced by tuning the principal axis of the ETP. An experiment is performed, and a microwave signal with a tunable frequency from 6.6 to 13.1 GHz and a tunable phase from -180° to 180° is generated. The phase noise performance of the generated microwave signal is also evaluated, which is -101.9 dBc/Hz at an offset of 10 kHz.
Keywords :
Bragg gratings; microwave generation; microwave oscillators; microwave photonics; optical fibre polarisation; optical modulation; optical noise; optical polarisers; optical tuning; phase noise; photodetectors; ETP; OEO loop; PS-FBG; PolM; SSB signal; electronically tunable polarizer; frequency 6.6 GHz to 13.1 GHz; frequency-tunable optoelectronic oscillator; microwave signal generation; optical carrier; phase noise performance; phase-shifted fiber Bragg grating; phase-tunable optoelectronic oscillator; photodetector; polarization modulator; principal axis; single-sideband polarization-modulated signal; wavelength tuning; Microwave photonics; microwave signal generation; optoelectronic oscillator (OEO); polarization modulation;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2013.2257717