Title :
A Semi Automated Scalar-Vector Setup for Load and Source Pull Measurement
Author :
Avasarala, Madhu
Author_Institution :
Avantek Inc.
Abstract :
A semi automated scalar vector measurement setup for the characterization of a GaAs power FET is described. Input and output impedances of a power FET can be measured as a function of a scalar parameter such as Pout, gain, efficiency, AM/PM, etc. Computer control enables quick, accurate and repeatable measurements right up to the chip device plane. Results of a single stage Internally Matched power FET designed using measurements from the above setup are given.
Keywords :
Automatic control; FETs; Frequency; Gain measurement; Gallium arsenide; Impedance measurement; Laboratories; Power measurement; Semiconductor device measurement; Tuners;
Conference_Titel :
ARFTG Conference Digest-Spring, 25th ARFTG
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1985.323622
