DocumentCode
1823858
Title
A Semi Automated Scalar-Vector Setup for Load and Source Pull Measurement
Author
Avasarala, Madhu
Author_Institution
Avantek Inc.
Volume
7
fYear
1985
fDate
31199
Firstpage
80
Lastpage
94
Abstract
A semi automated scalar vector measurement setup for the characterization of a GaAs power FET is described. Input and output impedances of a power FET can be measured as a function of a scalar parameter such as Pout, gain, efficiency, AM/PM, etc. Computer control enables quick, accurate and repeatable measurements right up to the chip device plane. Results of a single stage Internally Matched power FET designed using measurements from the above setup are given.
Keywords
Automatic control; FETs; Frequency; Gain measurement; Gallium arsenide; Impedance measurement; Laboratories; Power measurement; Semiconductor device measurement; Tuners;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 25th ARFTG
Conference_Location
St. Louis, MO, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1985.323622
Filename
4119025
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