Title :
" A Microstrip Chip Carrier and Insert for the Transistor Test Fixture"
Author :
Simpson, Gary R. ; Lane, Richard Q.
Author_Institution :
Maury Microwave Corporation, Rancho Cucamonga, CA
Abstract :
A microstrip insert is being developed for the Transistor Test Fixture (TTF) to provide accurate and convenient measurement of chip transistors up to 18 GHz. Chips are mounted on drop-in microstrip carriers. Calibration is done at a microstrip reference plane using drop-in calibration standards. This paper is a progress report and will discuss methods of calibration, actual measured data on chip transistors, and some pitfalls and their solutions.
Keywords :
Calibration; Coaxial components; Conductors; Dielectric substrates; Fixtures; Microstrip; Microwave transistors; Packaging; Semiconductor device measurement; Testing;
Conference_Titel :
ARFTG Conference Digest-Spring, 25th ARFTG
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1985.323626
