DocumentCode :
1823953
Title :
Generalized reconstruction by inversion of coupled systems (GRICS) applied to parallel MRI
Author :
Odille, F. ; Vuissoz, P.-A. ; Felblinger, J. ; Atkinson, D.
Author_Institution :
INSERM, Nancy Univ., Nancy
fYear :
2008
fDate :
14-17 May 2008
Firstpage :
1019
Lastpage :
1022
Abstract :
This paper presents a framework allowing parallel MRI to be optimized. Parallel imaging relies on good coil sensitivity map estimates. As these sensitivities are determined experimentally, errors may occur during their assessment, whether using prior calibration (due to patient motion between calibration and actual scan), or autocalibration (due to lower resolution, suboptimal estimates). Here we reformulate reconstruction as a coupled inverse problem, consisting of simultaneously solving the parallel imaging problem, based on SENSE algorithm, and minimizing the propagation of sensitivity map errors in that reconstruction. The problem is practically solved using a multiresolution fixed-point iterative method, producing both the reconstructed image and optimized sensitivity maps. The method was validated by comparing sensitivity maps and reconstructed images obtained by standard SENSE reconstruction, based on a reduced number of autocalibration signal (ACS) data, to those obtained by the proposed method, starting from the same ACS data as initial guess.
Keywords :
calibration; image reconstruction; inverse problems; medical image processing; GRICS method; SENSE algorithm; calibration; coil sensitivity map estimate; coupled inverse problem; generalized reconstruction by inversion of coupled systems; parallel MRI; Calibration; Coils; Image reconstruction; Image resolution; Inverse problems; Iterative algorithms; Iterative methods; Magnetic resonance imaging; Motion estimation; Signal resolution; Coupled problems; fixed-point iteration; magnetic resonance; parallel imaging; recontruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
Type :
conf
DOI :
10.1109/ISBI.2008.4541172
Filename :
4541172
Link To Document :
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