DocumentCode :
1823971
Title :
ESD simulation with Wunsch-Bell based behavior modeling methodology
Author :
Cao, Yiqun ; Glaser, Ulrich ; Willemen, Joost ; Magrini, Filippo ; Mayerhofer, Michael ; Frei, Stephan ; Stecher, Matthias
fYear :
2011
fDate :
11-16 Sept. 2011
Firstpage :
1
Lastpage :
10
Abstract :
Conventional modeling methods for ESD protection can be specific to device types or cannot reproduce the self-heating effect. This work proposes a straightforward modeling methodology based on the Wunsch-Bell characterization method using TLP. It allows precise ESD simulation verified by measurements.
Keywords :
electrostatic discharge; printed circuit testing; TLP; Wunsch-Bell based behavior modeling; electrostatic discharge protection; printed circuit testing; self-heating effect; transmission line pulsing; Clamps; Data models; Electrostatic discharge; Fitting; Integrated circuit modeling; Transient analysis; Video recording;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
ISSN :
Pending
Electronic_ISBN :
Pending
Type :
conf
Filename :
6045589
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1823971
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