Title :
Capturing real world ESD stress with event detector
Author :
Jahanzeb, Agha ; Wang, Kankan ; Harrop, Jeff ; Brodsky, Jonathan ; Ban, Toshio ; Ward, Scott ; Schichl, Joe ; Burgess, Keith ; Duvvury, Charvaka
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
This paper presents a study of detecting ESD stresses wirelessly in order to capture real world events. An example of a product field failure and its debug is provided using this technique. Correlation of the waveforms with Charged Device Model (CDM) and Charged Board Event (CBE) tests is also presented.
Keywords :
electrostatic discharge; sensors; CBE; CDM; ESD stress; charged board event; charged device model; debug; event detector; product field failure; Antenna measurements; Antennas; Detectors; Discharges; Electrostatic discharge; Production; Stress;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
