• DocumentCode
    1824057
  • Title

    A spatial multivariate process capability index

  • Author

    Wang, Shaoxi ; Yeh, Arthur B.

  • Author_Institution
    Coll. of Software & Microelectron., Northwestern Polytech. Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    1443
  • Lastpage
    1445
  • Abstract
    Process capability ultimately decides process quality level. Based on analyzing process capability index (PCI), Process capability may be effectively assured. For the multivariate manufacturing processes, tremendous difficulties are often encountered when one attempts to measure the process capability by directly extending the univariate approach. After analyzing the multivariate Cpm method (Chan et al. 1991), the paper presents a spatial multivariate PCI method, which can solve multivariate off-centered case and may provide references for assuring and improving process quality level while achieving overall evaluation of process quality. At last, examples for calculating multivariate PCI are given and the experimental results show that the systematic method presented is effective and actual.
  • Keywords
    manufacturing processes; process capability analysis; quality control; multivariate manufacturing process; process quality level; spatial multivariate process capability index; Correlation; Equations; Gaussian distribution; Indexes; Manufacturing processes; Mathematical model; Systematics; multivariate; off-center; process; process capability index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674321
  • Filename
    5674321