DocumentCode
1824057
Title
A spatial multivariate process capability index
Author
Wang, Shaoxi ; Yeh, Arthur B.
Author_Institution
Coll. of Software & Microelectron., Northwestern Polytech. Univ., Xi´´an, China
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
1443
Lastpage
1445
Abstract
Process capability ultimately decides process quality level. Based on analyzing process capability index (PCI), Process capability may be effectively assured. For the multivariate manufacturing processes, tremendous difficulties are often encountered when one attempts to measure the process capability by directly extending the univariate approach. After analyzing the multivariate Cpm method (Chan et al. 1991), the paper presents a spatial multivariate PCI method, which can solve multivariate off-centered case and may provide references for assuring and improving process quality level while achieving overall evaluation of process quality. At last, examples for calculating multivariate PCI are given and the experimental results show that the systematic method presented is effective and actual.
Keywords
manufacturing processes; process capability analysis; quality control; multivariate manufacturing process; process quality level; spatial multivariate process capability index; Correlation; Equations; Gaussian distribution; Indexes; Manufacturing processes; Mathematical model; Systematics; multivariate; off-center; process; process capability index;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location
Macao
ISSN
2157-3611
Print_ISBN
978-1-4244-8501-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2010.5674321
Filename
5674321
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