Title :
A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals
Author :
Lee, Jongsung ; Lim, Jaedeok ; Jo, Cheolgu ; Seol, Byongsu ; Nandy, Argha ; Li, Tianqi ; Pommerenke, David
Author_Institution :
Samsung Electron. Co., Ltd., Suwon, South Korea
Abstract :
A methodology to measure and simulate ESD induced noise on active IC Pins is introduced. A simple experimental setup injects ESD noise from an ESD generator and captures the waveforms. Secondly, the waveforms are simulated using a combination of 3D simulation and SPICE modeling.
Keywords :
SPICE; electric noise measurement; electrostatic discharge; integrated circuit noise; 3D simulation; ESD generator; ESD induced noise measurement; ESD induced noise simulation; SPICE modeling; active IC pin; signal disturbance; soft-error; Electrostatic discharge; Generators; Integrated circuit modeling; Noise; Numerical models; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
