• DocumentCode
    1824305
  • Title

    A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals

  • Author

    Lee, Jongsung ; Lim, Jaedeok ; Jo, Cheolgu ; Seol, Byongsu ; Nandy, Argha ; Li, Tianqi ; Pommerenke, David

  • Author_Institution
    Samsung Electron. Co., Ltd., Suwon, South Korea
  • fYear
    2011
  • fDate
    11-16 Sept. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A methodology to measure and simulate ESD induced noise on active IC Pins is introduced. A simple experimental setup injects ESD noise from an ESD generator and captures the waveforms. Secondly, the waveforms are simulated using a combination of 3D simulation and SPICE modeling.
  • Keywords
    SPICE; electric noise measurement; electrostatic discharge; integrated circuit noise; 3D simulation; ESD generator; ESD induced noise measurement; ESD induced noise simulation; SPICE modeling; active IC pin; signal disturbance; soft-error; Electrostatic discharge; Generators; Integrated circuit modeling; Noise; Numerical models; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
  • Conference_Location
    Anaheim, CA
  • ISSN
    Pending
  • Electronic_ISBN
    Pending
  • Type

    conf

  • Filename
    6045600
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1824305