• DocumentCode
    1824336
  • Title

    Measurements and simulations in product specific risk analysis

  • Author

    Reinvuo, Tuomas ; Tamminen, Pasi

  • Author_Institution
    Nokia Corp., Oulu, Finland
  • fYear
    2011
  • fDate
    11-16 Sept. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    System level ESD risk analyses are challenging to make with HBM, CDM or IEC HBM validation methods. This paper presents alternative ESD risk analysis which bases on charged board event measurements and simulations and compares the result to standardized IEC HBM validation.
  • Keywords
    charge measurement; electrostatic discharge; risk analysis; CDM; IEC HBM validation methods; charged board event measurements; product specific risk analysis; system level ESD risk analyses; Current measurement; Discharges; Electrical resistance measurement; Electrostatic discharge; Hidden Markov models; IEC; Integrated circuit modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
  • Conference_Location
    Anaheim, CA
  • ISSN
    Pending
  • Electronic_ISBN
    Pending
  • Type

    conf

  • Filename
    6045601
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1824336