Title :
Gyroelectric properties of indium antimonide at terahertz frequencies
Author :
Tio, Lian Yuh ; Davis, L.E.
Author_Institution :
Dept. of Electr. Eng. & Electron., UMIST, Manchester, UK
Abstract :
The behaviour of a magnetised semiconductor can be characterised by a permittivity tensor, which combines the ohmic and displacement currents. The frequency dependence of the permittivity tensor elements is described. A semiconductor that is magnetised transverse to the direction of propagation such that the microwave electric field is perpendicular to applied static magnetic field (i.e. a TM mode) is described by an effective permittivity, εeff. The variation of εeff of indium antimonide (εr =17.7) as a function of frequency up to the terahertz region is described. The reflection and transmission coefficients for oblique incidence on a simple dielectric and semiconductor interface have been derived and it can be shown that a reflectionless condition is achievable only at normal incidence. The frequency dependence of the complex reflection coefficient for normal incidence is presented and discussed
Keywords :
III-V semiconductors; electromagnetic wave reflection; electromagnetic wave transmission; high-frequency effects; indium compounds; magnetisation; microwave materials; permittivity; waveguide components; InSb; applied static magnetic field; dielectric/semiconductor interface; displacement currents; effective permittivity; frequency dependence; gyroelectric properties; indium antimonide; magnetised semiconductor; microwave electric field; normal incidence; oblique incidence; ohmic currents; permittivity tensor; permittivity tensor elements; propagation direction; reflection coefficients; reflectionless condition; transmission coefficients; transverse magnetised semiconductor; Electrons; Ferrites; Frequency dependence; Indium; Magnetic materials; Magnetic semiconductors; Permittivity; Reflection; Semiconductor materials; Tensile stress;
Conference_Titel :
High Frequency Postgraduate Student Colloquium, 2001. 6th IEEE
Conference_Location :
Cardiff
Print_ISBN :
0-7803-7118-6
DOI :
10.1109/HFPSC.2001.962165