DocumentCode
1824649
Title
Extraction of state function behaviour from large signal waveform measurements [pHEMTs]
Author
Morgan, David G. ; Tasker, Paul J.
Author_Institution
Cardiff Univ., UK
fYear
2001
fDate
2001
Firstpage
88
Lastpage
93
Abstract
The nonlinear state functions of the pHEMT (pseudomorphic high electron mobility transistor) are fully extracted using dynamic measurements only. A systematic reverse waveform measurement technique combined with forward waveform measurements yield the intrinsic current and charge surface state functions. The reverse extraction results have been verified to be bias and power level independent and the resultant state functions obtained are confirmed to be unique. The technique shown is able to completely characterise state function behaviour and hence minimizes the extrapolation problems associated with existing state function extraction techniques
Keywords
high electron mobility transistors; microwave field effect transistors; semiconductor device measurement; bias level independent reverse extraction; charge surface state function; current surface state function; dynamic measurements; extrapolation; forward waveform measurements; large signal waveform measurements; nonlinear state functions; pHEMT; power level independent reverse extraction; pseudomorphic high electron mobility transistor; state function behaviour extraction; state function extraction techniques; systematic reverse waveform measurement technique; Current measurement; Frequency measurement; Measurement techniques; PHEMTs; RF signals; Radio frequency; Scattering parameters; Software measurement; Table lookup; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
High Frequency Postgraduate Student Colloquium, 2001. 6th IEEE
Conference_Location
Cardiff
Print_ISBN
0-7803-7118-6
Type
conf
DOI
10.1109/HFPSC.2001.962171
Filename
962171
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