• DocumentCode
    1824649
  • Title

    Extraction of state function behaviour from large signal waveform measurements [pHEMTs]

  • Author

    Morgan, David G. ; Tasker, Paul J.

  • Author_Institution
    Cardiff Univ., UK
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    88
  • Lastpage
    93
  • Abstract
    The nonlinear state functions of the pHEMT (pseudomorphic high electron mobility transistor) are fully extracted using dynamic measurements only. A systematic reverse waveform measurement technique combined with forward waveform measurements yield the intrinsic current and charge surface state functions. The reverse extraction results have been verified to be bias and power level independent and the resultant state functions obtained are confirmed to be unique. The technique shown is able to completely characterise state function behaviour and hence minimizes the extrapolation problems associated with existing state function extraction techniques
  • Keywords
    high electron mobility transistors; microwave field effect transistors; semiconductor device measurement; bias level independent reverse extraction; charge surface state function; current surface state function; dynamic measurements; extrapolation; forward waveform measurements; large signal waveform measurements; nonlinear state functions; pHEMT; power level independent reverse extraction; pseudomorphic high electron mobility transistor; state function behaviour extraction; state function extraction techniques; systematic reverse waveform measurement technique; Current measurement; Frequency measurement; Measurement techniques; PHEMTs; RF signals; Radio frequency; Scattering parameters; Software measurement; Table lookup; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Frequency Postgraduate Student Colloquium, 2001. 6th IEEE
  • Conference_Location
    Cardiff
  • Print_ISBN
    0-7803-7118-6
  • Type

    conf

  • DOI
    10.1109/HFPSC.2001.962171
  • Filename
    962171