DocumentCode
1824726
Title
Measurement of the spatial resolution of wide-pitch silicon strip detectors with large incident angle
Author
Kawasaki, T. ; Hazumi, M. ; Nagashima, Y. ; Senyo, K. ; Sumisawa, K. ; Takegai, T. ; Haba, J.
Author_Institution
Graduate Sch. of Sci., Osaka Univ., Japan
Volume
1
fYear
1996
fDate
2-9 Nov 1996
Firstpage
553
Abstract
As a part of R&D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0° to 75°. These detectors have strips with pitches of 50, 125 and 250 μm on the ohmic side. We have obtained the incident angle dependence which agreed well with a Monte Carlo simulation. The resolution was found to be 11 μm for normal incidence with a pitch of 50 μm, and 29 μm for incident angle of 75° with a pitch of 250 μm
Keywords
Monte Carlo methods; position sensitive particle detectors; silicon radiation detectors; 11 mum; 125 mum; 150 mum; 29 mum; 50 mum; BELLE experiment; Monte Carlo simulation; Si; Si strip detectors; incident angle; normal incidence; ohmic side; spatial resolution; wide-pitch; Capacitance; Current measurement; Decision support systems; Detectors; Energy measurement; Laboratories; Silicon; Spatial resolution; Strips; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
0-7803-3534-1
Type
conf
DOI
10.1109/NSSMIC.1996.591059
Filename
591059
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