Title : 
Filter models of CDM measurement channels and TLP device transients
         
        
            Author : 
Maloney, Timothy J. ; Daniel, Abishai
         
        
            Author_Institution : 
Intel Corp., Santa Clara, CA, USA
         
        
        
        
        
        
            Abstract : 
Charged Device Model (CDM) waveforms are fast enough to be altered considerably by the oscilloscope used. Step response of CDM measurement channels allow time-domain finite impulse response (FIR) filters to be formulated in software. Similar analytic methods allow filter-like representation of devices as measured by transmission-line pulsing (TLP).
         
        
            Keywords : 
FIR filters; oscilloscopes; CDM measurement channels; TLP device transients; charged device model measurement channels; charged device model waveforms; filter models; filter-like representation; oscilloscope; time-domain FIR filters; time-domain finite impulse response filter; transmission-line pulsing device transient; Convolution; Filtering theory; Finite impulse response filter; Generators; IIR filters; Oscilloscopes; Transmission line measurements;
         
        
        
        
            Conference_Titel : 
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
         
        
            Conference_Location : 
Anaheim, CA
         
        
        
            Electronic_ISBN : 
Pending