Title :
Filter models of CDM measurement channels and TLP device transients
Author :
Maloney, Timothy J. ; Daniel, Abishai
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Charged Device Model (CDM) waveforms are fast enough to be altered considerably by the oscilloscope used. Step response of CDM measurement channels allow time-domain finite impulse response (FIR) filters to be formulated in software. Similar analytic methods allow filter-like representation of devices as measured by transmission-line pulsing (TLP).
Keywords :
FIR filters; oscilloscopes; CDM measurement channels; TLP device transients; charged device model measurement channels; charged device model waveforms; filter models; filter-like representation; oscilloscope; time-domain FIR filters; time-domain finite impulse response filter; transmission-line pulsing device transient; Convolution; Filtering theory; Finite impulse response filter; Generators; IIR filters; Oscilloscopes; Transmission line measurements;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending