DocumentCode
1824860
Title
A single chart for monitoring frequency and magnitude of events
Author
Wu, Z. ; Qu, L.
Author_Institution
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
1416
Lastpage
1420
Abstract
This article presents a single Statistical Process Control (SPC) chart for simultaneously monitoring the time interval T and magnitude X of an event. The new chart is called a G chart as it deals with a synthetic statistic G. The G chart makes use of the information about the event frequency as well as the information about the event magnitude. Moreover, its detection power can be allocated in an optimal manner between that against T shifts and that against X shifts, and between that against small shifts and that against large shifts. As a result, the G chart is more effective than all other charts currently available in the literature for detecting the out-of-control status of an event. Moreover, comparing with other charts, the G chart performs more uniformly for detecting process shifts of different types and sizes.
Keywords
control charts; process monitoring; quality control; statistical process control; SPC chart; event frequency monitoring; event magnitude monitoring; event time interval monitoring; quality control; statistical process control chart; synthetic statistic; Accidents; Control charts; Frequency control; Helium; Monitoring; Optimization; Process control; Quality control; average loss; control chart; magnitude of event; statistical process control; time between events;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location
Macao
ISSN
2157-3611
Print_ISBN
978-1-4244-8501-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2010.5674350
Filename
5674350
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