• DocumentCode
    1824883
  • Title

    Niobium as new material for electrolyte capacitors with nanoscale dielectric oxide layers

  • Author

    Fischer, V. ; Störmer, H. ; Gerthsen, D. ; Stenzel, M. ; Zillgen, H. ; Ivers-Tiffée, E.

  • Author_Institution
    Inst. fur Werkstoffkunde der Elektrotech., Karlsruhe Univ., Germany
  • Volume
    3
  • fYear
    2003
  • fDate
    1-5 June 2003
  • Firstpage
    1134
  • Abstract
    New niobium electrolyte capacitors were produced on the base of newly developed capacitorgrade niobium metal powder. To gain a comprehensive understanding of the reactions taking place during the fabrication process which comprises several anodic oxidation and thermal treatment steps, the influence of heat treatments on the electrical and structural properties of the nanoscale dielectric niobium pentoxide layers was investigated. Capacitance measurements at fixed frequency were used to examine the electrical properties of the dielectric oxide layers directly after oxidation steps and heat treatments. Thermogravimetric analysis was applied to characterize the behavior of oxidized niobium anodes during the thermal annealing processes. Scanning electron and high-resolution transmission electron microscopy was performed in order to determine the thickness and microstructure of the nanoscale dielectric niobium pentoxide layers. In the following, the first results of these characterizations will be presented.
  • Keywords
    annealing; capacitance measurement; crystal microstructure; electrolytic capacitors; heat treatment; nanostructured materials; nanotechnology; niobium compounds; scanning electron microscopy; thermal analysis; transmission electron microscopy; Nb2O5; anodic oxidation; capacitance measurement; capacitorgrade niobium metal powder; electrical properties; heat treatment; high resolution transmission electron microscopy; microstructure; nanoscale dielectric niobium pentoxide layer; nanoscale dielectric oxide layer; niobium; niobium electrolyte capacitor; oxidized niobium anode; scanning electron microscopy; structural properties; thermal annealing; thermal treatment; thermogravimetric analysis; Capacitance measurement; Capacitors; Dielectric materials; Electrons; Fabrication; Heat treatment; Niobium compounds; Oxidation; Powders; Resistance heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
  • ISSN
    1081-7735
  • Print_ISBN
    0-7803-7725-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.2003.1218623
  • Filename
    1218623