• DocumentCode
    1824907
  • Title

    An integrated T and TCUSUM scheme

  • Author

    Qu, L.

  • Author_Institution
    Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    1411
  • Lastpage
    1415
  • Abstract
    This article proposes an integrated scheme (T&TCUSUM chart) which combines a Shewhart T chart and a TCUSUM chart (a CUSUM-type T chart) to monitor the time interval T between the occurrences of an event or the time between events (TBE). The performance studies show that the T&TCUSUM chart can effectively improve the overall performance over the entire T shift range. On average, it is more effective than the T chart by 26.66% and the TCUSUM chart by 14.12%. Moreover, the T&TCUSUM chart performs more uniformly than other charts for detecting both small and large T shifts, because it has the strength of both the T chart (more sensitive to large shifts) and the TCUSUM chart (more sensitive to small shifts). The implementation of the new chart is almost as easy as the operation of a TCUSUM chart.
  • Keywords
    control charts; quality control; statistical process control; Shewhart T chart; T chart; T shift range; TCUSUM chart; integrated T-TCUSUM scheme; time between events; time interval monitoring; Control charts; Exponential distribution; Frequency control; Monitoring; Process control; Quality control; Reliability engineering; CUSUM chart; Quality control; average loss; control chart; statistical process control; steady-state ATS; time between events;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674351
  • Filename
    5674351