Title :
Measurement systems for the analysis of distortions caused by the passage band signals through nonlinear devices
Author :
Voronin, N.N. ; Abramenko, Aleksandr Y. ; Goshin, G.G. ; Vasiliev, Andrey S.
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
Abstract :
The work on creation a measurement system is represented. It allows analyzing the distortions arising in the passing band signals through nonlinear devices. The experimental data obtained for the two types of probe signals are given. Prospects of development of the complex and the software for it are announced.
Keywords :
distortion measurement; measurement systems; distortion analysis; measurement systems; nonlinear devices; passage band signals; Distortion measurement; Frequency measurement; Nonlinear distortion; Probes; Signal generators; Vectors; Band signal; Fourier transform; amplifier; vector signal generator;
Conference_Titel :
Micro/Nanotechnologies and Electron Devices (EDM), 2013 14th International Conference of Young Specialists on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4799-0761-8
DOI :
10.1109/EDM.2013.6641950
