Title :
An Improved Open for Calibrating Sexed VANA Test Ports
Author :
Simpson, Gary R.
Author_Institution :
Maury Microwave Corporation, Cucamonga, CA
Abstract :
The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA´s) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.
Keywords :
Automatic testing; Calibration; Capacitance; Circuit testing; Conductors; Connectors; Contacts; Geometry; Loss measurement; Microwave circuits;
Conference_Titel :
ARFTG Conference Digest-Spring, 27th ARFTG
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1986.323667
