Title :
A Calibration Method for De-Embedding a Microwave Test Fixture
Author :
Rosenbaum, S.E. ; Pitzalis, O., Jr. ; Marzan, J.M.
Author_Institution :
Hughes Research Laboratories, Malibu, CA 90265
Abstract :
A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.
Keywords :
Calibration; Circuit testing; Fixtures; Integrated circuit measurements; Integrated circuit testing; MMICs; Microwave devices; Microwave measurements; Microwave theory and techniques; Microwave transistors;
Conference_Titel :
ARFTG Conference Digest-Spring, 27th ARFTG
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1986.323670
