DocumentCode
1825121
Title
[Front cover]
fYear
2011
fDate
11-16 Sept. 2011
Abstract
The following topics are dealt with: CMOS protection; smart power technology; RF circuits; ESD analysis techniques; MEMS; integrated circuit packaging; integrated circuit reliability; system level testing; ESD electronic design automation; CDM device testers; TLP device testers; and HBM device testers.
Keywords
CMOS integrated circuits; electronic design automation; electrostatic discharge; integrated circuit packaging; integrated circuit reliability; micromechanical devices; microwave circuits; test equipment; CDM device testers; CMOS protection; ESD analysis techniques; ESD electronic design automation; HBM device testers; MEMS; RF circuits; TLP device testers; integrated circuit packaging; integrated circuit reliability; smart power technology; system level testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045632
Link To Document