• DocumentCode
    1825200
  • Title

    Inhomogeneous cellular automata for weighted random pattern generation

  • Author

    Neebel, Danial J. ; Kime, Charles R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    1013
  • Lastpage
    1022
  • Abstract
    Weighted random pattern testing methods produce higher fault coverage with shorter test lengths than random pattern testing methods. Here we present the weighted cellular automaton (WCA), an inhomogeneous cellular automaton that generates weighted random patterns on a test per clock basis. The WCA is a complete automaton that contains no external weighting logic and no multiplexers between flip-flop outputs and the circuit under test that add to critical path delays. Since the structure is based on cellular automata there are no complex routing problems. We also give a design algorithm, WCARGO, that automatically generates WCA from an ordered set of weights
  • Keywords
    automatic testing; cellular automata; fault diagnosis; logic testing; random processes; fault coverage; inhomogeneous cellular automaton; random pattern testing; test lengths; weighted cellular automaton; weighted random pattern generation; Automata; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Clocks; Logic circuits; Logic testing; Multiplexing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470597
  • Filename
    470597