Title :
In Search of a More Realistic Accuracy Statement for Microwave Metrology
Author_Institution :
National Bureau of Standards
Keywords :
Connectors; Detectors; Hardware; Instruments; Metrology; Microwave measurements; NIST; Random variables; Reflection; Testing;
Conference_Titel :
ARFTG Conference Digest-Spring, 27th ARFTG
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1986.323674
