Title :
Precise measurement of field patterns from a TE02 mode converter using the electro-optic probe scanning system
Author :
Ingeun Lee ; Kwang Hoon Kim ; Mun Seok Choe ; Dong-Joon Lee ; Eunmi Choi
Author_Institution :
Dept. of Electr. Eng., Ulsan Nat. Inst. of Sci. & Technol. (UNIST), Ulsan, South Korea
Abstract :
This paper presents electric field pattern measurements by an excellent field scanning system using a stable electro-optic (EO) field probe. It provides higher resolution and less field distortions than a metal based probe. We simulated a TE02 gyrotron mode converter by CST Microwave Studio and estimated the mode converter field pattern at 28 GHz. The field-calibrated EO sensor demonstrated up to 60 dB of Signal to Noise Ratio (SNR). Finally, we compared both results using the Cross Correlation Function (CCF). The schematic of the EO probe scanning system and estimation results are provided.
Keywords :
electro-optical devices; gyrotrons; probes; CST Microwave Studio; SNR; cross correlation function; electric field pattern measurements; electro-optic probe scanning system; field scanning system; field-calibrated EO sensor; frequency 28 GHz; gyrotron mode converter; metal based probe; mode converter field pattern; signal to noise ratio; Correlation; Electrooptical waveguides; Gyrotrons; Measurement by laser beam; Probes; Signal to noise ratio; Temperature sensors; Cross Correlation Function (CCF); EO probe; Gyrotron mode converter;
Conference_Titel :
Vacuum Electronics Conference, IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IVEC.2014.6857693
