Precise measurement of field patterns from a TE02 mode converter using the electro-optic probe scanning system

Author

Ingeun Lee ; Kwang Hoon Kim ; Mun Seok Choe ; Dong-Joon Lee ; Eunmi Choi

Author_Institution

Dept. of Electr. Eng., Ulsan Nat. Inst. of Sci. & Technol. (UNIST), Ulsan, South Korea

fYear

2014

fDate

22-24 April 2014

Firstpage

469

Lastpage

470

Abstract

This paper presents electric field pattern measurements by an excellent field scanning system using a stable electro-optic (EO) field probe. It provides higher resolution and less field distortions than a metal based probe. We simulated a TE₀₂ gyrotron mode converter by CST Microwave Studio and estimated the mode converter field pattern at 28 GHz. The field-calibrated EO sensor demonstrated up to 60 dB of Signal to Noise Ratio (SNR). Finally, we compared both results using the Cross Correlation Function (CCF). The schematic of the EO probe scanning system and estimation results are provided.

Keywords

electro-optical devices; gyrotrons; probes; CST Microwave Studio; SNR; cross correlation function; electric field pattern measurements; electro-optic probe scanning system; field scanning system; field-calibrated EO sensor; frequency 28 GHz; gyrotron mode converter; metal based probe; mode converter field pattern; signal to noise ratio; Correlation; Electrooptical waveguides; Gyrotrons; Measurement by laser beam; Probes; Signal to noise ratio; Temperature sensors; Cross Correlation Function (CCF); EO probe; Gyrotron mode converter;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference, IEEE International

Conference_Location

Monterey, CA

Type

conf

DOI

10.1109/IVEC.2014.6857693

Filename

6857693