Title :
60th ARFTG Conference Digest. Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies (Cat. No.02EX739)
Abstract :
Presents the front cover, front matter, and table of contents from the conference proceedings.
Keywords :
integrated circuit design; millimetre wave measurement; network analysers; optical communication; power amplifiers; VNA accuracy; large signal measurement; linear calibration; measurement related modeling; millimeter-wave measurement; optical measurement; vector network analyzer;
Conference_Titel :
ARFTG Conference Digest, Fall 2002. 60th
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-8124-6
DOI :
10.1109/ARFTGF.2002.1218679
