DocumentCode :
1825587
Title :
Learning to deduplicate
Author :
De Carvalho, Moisés G. ; Gonçalves, Marcos André ; Laender, Alberto H F ; Silva, Altigran S da
Author_Institution :
Comput. Sci. Dept., Fed. Univ. of Minas Gerais, Belo Horizonte
fYear :
2006
fDate :
38869
Firstpage :
41
Lastpage :
50
Abstract :
Identifying record replicas in digital libraries and other types of digital repositories is fundamental to improve the quality of their content and services as well as to yield eventual sharing efforts. Several deduplication strategies are available, but most of them rely on manually chosen settings to combine evidence used to identify records as being replicas. In this paper, we present the results of experiments we have carried out with a novel machine learning approach we have proposed for the deduplication problem. This approach, based on genetic programming (GP), is able to automatically generate similarity functions to identify record replicas in a given repository. The generated similarity functions properly combine and weight the best evidence available among the record fields in order to tell when two distinct records represent the same real-world entity. The results of the experiments show that our approach outperforms the baseline method by Fellegi and Sunter by more than 12% when identifying replicas in a data set containing researcher´s personal data, and by more than 7%, in a data set with article citation data
Keywords :
citation analysis; digital libraries; genetic algorithms; learning (artificial intelligence); meta data; citation data; deduplication strategies; digital library; genetic programming; machine learning approach; record replicas; Books; Computer science; Genetic programming; Information retrieval; Machine learning; Optical character recognition software; Permission; Quality management; Software libraries; Writing; deduplication; digital libraries; genetic programming;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Libraries, 2006. JCDL '06. Proceedings of the 6th ACM/IEEE-CS Joint Conference on
Conference_Location :
Chapel Hill, NC
Print_ISBN :
1-59593-354-9
Type :
conf
DOI :
10.1145/1141753.1141760
Filename :
4119095
Link To Document :
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