• DocumentCode
    1825775
  • Title

    A SPICE model of double-sided Si microstrip detectors

  • Author

    Candelori, A. ; Paccagnella, A. ; Bonin, F. ; Bacchetta, N. ; Rold, M. Da ; Bisello, D.

  • Author_Institution
    Dipartimento di Elettronica e Inf., Padova Univ., Italy
  • Volume
    1
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    568
  • Abstract
    We have developed a SPICE model for the ohmic side of AC-coupled Si microstrip detectors with interstrip isolation via field plates. The interstrip isolation has been measured in various conditions by varying the field plate voltage. Simulations have been compared with experimental data in order to determine the values of the model parameters for different voltages applied to the field plates. The model is able to predict correctly the frequency dependence of the coupling between adjacent strips. Furthermore, we have used such model for the study of the signal propagation along the detector when a current signal is injected in a strip. Only electrical coupling is considered here, without any contribution due to charge sharing derived from carrier diffusion. For this purpose, the AC pads of the strips have been connected to a read-out electronics and the current signal has been injected into a DC pad. Good agreement between measurements and simulations has been reached for the central strip and the first neighbours. Experimental tests and computer simulations have been performed for four different strip and field plate layouts, in order to investigate how the detector geometry affects the parameters of the SPICE model and the signal propagation
  • Keywords
    SPICE; semiconductor device models; silicon radiation detectors; AC-coupled Si microstrip detectors; SPICE model; Si; Si double-sided microstrip detectors; carrier diffusion; charge sharing; detector geometry; field plates; interstrip isolation; ohmic side; read-out electronics; signal propagation; Computational modeling; Couplings; Detectors; Frequency dependence; Microstrip; Predictive models; SPICE; Strips; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591063
  • Filename
    591063