“In system” transparent autodiagnostics of RAMs

Author

Sosnowski, Janusz

Author_Institution

Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland

fYear

1993

fDate

17-21 Oct 1993

Firstpage

835

Lastpage

844

Abstract

In this paper we present an original technique of testing classical RAMs (without BIST) in real system environment. The developed testing methodology allows to cover a large class of faults including pattern sensitivity and dynamic faults. An important feature of the presented approach is test transparency which assures that at the end of the test the contents of the RAM are equal to its initial contents (before testing). This technique is especially useful for periodic autodiagnostic procedures in embedded and multiprocessor systems. It has been also extended for cache and dual port RAMs

Keywords

automatic testing; cache storage; fault diagnosis; logic testing; random-access storage; real-time systems; RAMs; cache storage; dual port RAMs; dynamic faults; in-system diagnostics; multiprocessor systems; pattern sensitivity; periodic autodiagnostic procedures; real system environment; test transparency; transparent autodiagnostics; Built-in self-test; Cache memory; Circuit faults; Circuit testing; Multiprocessing systems; Performance evaluation; Random access memory; Read only memory; Read-write memory; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1993. Proceedings., International

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-1430-1

Type

conf

DOI

10.1109/TEST.1993.470618

Filename

470618