Title :
Nose-to-nose oscilloscope calibration phase error inherent in the sampling circuitry
Author_Institution :
RF Electron. Group, National Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We use SPICE simulations to study the dependence of the phase error in the nose-to-nose oscilloscope calibration on the oscilloscope´s sampling circuitry. We determine which components of the internal sampling circuitry of the oscilloscope contribute most significantly to errors in the nose-to-nose calibration. We then predict an expected range of phase errors from a range of realistic component values.
Keywords :
SPICE; calibration; oscilloscopes; sensitivity analysis; signal sampling; SPICE simulation; nose-to-nose oscilloscope calibration; phase error; sampling circuitry; Calibration; Circuit simulation; Circuit testing; Fabrication; NIST; Oscilloscopes; Phase estimation; Phase measurement; SPICE; Sampling methods;
Conference_Titel :
ARFTG Conference Digest, Fall 2002. 60th
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-8124-6
DOI :
10.1109/ARFTGF.2002.1218690