DocumentCode
1825907
Title
Internal waveform probing of HBT and HEMT MMIC power amplifiers
Author
Hwang, J.C.M.
Author_Institution
Lehigh Univ., Bethlehem, PA, USA
fYear
2002
fDate
5-6 Dec. 2002
Firstpage
111
Lastpage
112
Abstract
In this paper, a practical MMIC internal waveform probing technique has been developed. The technique can be used for model extraction, design verification, process diagnosis, and reliability assessment, as demonstrated in the above.
Keywords
MMIC power amplifiers; bipolar integrated circuits; integrated circuit testing; HBT; HEMT MMIC power amplifier; design verification; heterojunction bipolar transistor; high electron mobility transistor; internal waveform probing; model extraction; monolithic microwave integrated circuit; process diagnosis; reliability assessment; Frequency; HEMTs; Heterojunction bipolar transistors; MMICs; Manufacturing; Power amplifiers; Probes; Pulse amplifiers; Time domain analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest, Fall 2002. 60th
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-8124-6
Type
conf
DOI
10.1109/ARFTGF.2002.1218693
Filename
1218693
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