Title :
Internal waveform probing of HBT and HEMT MMIC power amplifiers
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Abstract :
In this paper, a practical MMIC internal waveform probing technique has been developed. The technique can be used for model extraction, design verification, process diagnosis, and reliability assessment, as demonstrated in the above.
Keywords :
MMIC power amplifiers; bipolar integrated circuits; integrated circuit testing; HBT; HEMT MMIC power amplifier; design verification; heterojunction bipolar transistor; high electron mobility transistor; internal waveform probing; model extraction; monolithic microwave integrated circuit; process diagnosis; reliability assessment; Frequency; HEMTs; Heterojunction bipolar transistors; MMICs; Manufacturing; Power amplifiers; Probes; Pulse amplifiers; Time domain analysis; Voltage;
Conference_Titel :
ARFTG Conference Digest, Fall 2002. 60th
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-8124-6
DOI :
10.1109/ARFTGF.2002.1218693
