DocumentCode :
1825956
Title :
Conditional partial volume correction for emission tomography: A wavelet-based hidden Markov model and multi-resolution approach
Author :
Pogam, Adrien Le ; Hatt, Mathieu ; Boussion, Nicolas ; Guilloteau, Denis ; Baulieu, Jean Louis ; Prunier, Caroline ; Turkheimer, Federico ; Visvikis, Dimitris
Author_Institution :
CHRU Bretonneau, Tours
fYear :
2008
fDate :
14-17 May 2008
Firstpage :
1319
Lastpage :
1322
Abstract :
The spatial resolution in emission tomography induces partial volume effects, leading to under-estimation of the real uptake and activity spillover. They can be corrected using either region of interest or voxel based approaches. We developed a voxel wise correction, based on the wavelet transform of two co-registered images in order to insert high resolution details of the anatomical image into the functional one. A limitation is the use of a global model which may create artefacts in the corrected image where there is no correlation between the two modalities. The aim of this work was to develop a conditional correction: a comparison between the two modalities using hidden Markov modelling and multi-resolution analysis was developed to allow such a correction. The process was successfully tested on synthetic and clinical images avoiding artefacts.
Keywords :
emission tomography; hidden Markov models; image registration; image resolution; medical image processing; wavelet transforms; clinical images; conditional partial volume correction; emission tomography; image artefacts; image coregistration; multiresolution analysis; partial volume effects; spatial resolution; synthetic images; wavelet-based hidden Markov model; Computed tomography; Discrete wavelet transforms; Hidden Markov models; Image resolution; Image segmentation; Magnetic resonance imaging; Multiresolution analysis; Spatial resolution; Wavelet domain; Wavelet transforms; PET; Wavelet; hidden Markov models; multi-resolution; partial volume effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
Type :
conf
DOI :
10.1109/ISBI.2008.4541247
Filename :
4541247
Link To Document :
بازگشت