Title :
Analytical approach to regularization design for isotropic spatial resolution
Author :
Fessler, Jeffrey A.
Author_Institution :
EECS Dept., Michigan Univ., MI, USA
Abstract :
In emission tomography, conventional quadratic regularization methods lead to nonuniform and anisotropic spatial resolution in penalized-likelihood (or MAP) reconstructed images, even for idealized shift-invariant imaging systems. Previous methods for designing regularizers that improve resolution uniformity have used matrix manipulations and discrete Fourier transforms. This paper describes a simpler approach for designing data-dependent, shift-variant regularizers. We replace the usual discrete system models used in statistical image reconstruction with locally shift-invariant, continuous-space approximations, and design the regularizer using analytical Fourier transforms. We discretize the final analytical solution to compute the regularizer coefficients. This new approach requires even less computation than previous approaches that used FFTs, and provides additional insight into the problem of designing regularization methods to achieve uniform, isotropic spatial resolution.
Keywords :
Fourier transforms; image reconstruction; image resolution; medical image processing; positron emission tomography; single photon emission computed tomography; analytical Fourier transforms; data-dependent shift-variant regularizers; discrete Fourier transforms; emission tomography; isotropic spatial resolution; locally shift-invariant continuous-space approximations; matrix manipulations; maximum a posteriori algorithm; penalized-likelihood reconstructed images; regularization design; resolution uniformity; statistical image reconstruction; Anisotropic magnetoresistance; Design methodology; Discrete Fourier transforms; Flexible printed circuits; Fourier transforms; Image analysis; Image reconstruction; Positron emission tomography; Reconstruction algorithms; Spatial resolution;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
Print_ISBN :
0-7803-8257-9
DOI :
10.1109/NSSMIC.2003.1352277