• DocumentCode
    1826140
  • Title

    Low power noise immune circuit for implantable CMOS neurochemical sensor applied in neural prosthetics

  • Author

    Poustinchi, M. ; Musallam, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
  • fYear
    2011
  • fDate
    April 27 2011-May 1 2011
  • Firstpage
    695
  • Lastpage
    699
  • Abstract
    In this manuscript, we present the features and describe the operation of a low power, noise immune circuit for a CMOS based neurochemical sensor for implantable neural prosthetics. This microsystem consists of a single ended low noise low power amplifier and an integrator, in addition to a 10-bit first order sigma delta Analog to Digital Converter (ADC). Using electrochemical techniques, it senses picoscale to microscale current which corresponds to micro molar neurotransmitter concentration and converts the measurement to a 10-bit digital code. Combining amperometry and fast-scan cyclic voltammetry electrochemical technique results in a sensor with a high selectivity while having elevated temporal resolution. The microsystem consumes 120.85 μW which is the lowest reported brain implant and biosensor power consumption. This circuit is designed in CMOS 0.18 μm technology. Integration is an averaging operation and provides significant noise immunity. The low noise characteristics of our design make this device suitable for the noisy environment often encountered in-vivo.
  • Keywords
    CMOS integrated circuits; amperometric sensors; biosensors; chemical sensors; neurophysiology; prosthetics; amperometry; biosensor power consumption; brain implant; fast-scan cyclic voltammetry; implantable CMOS neurochemical sensor; integrator; low power amplifier; neural prosthetics; neurotransmitter concentration; noise immune circuit; CMOS integrated circuits; Chemicals; Electrodes; Neurotransmitters; Noise; Power demand; Sigma delta modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Engineering (NER), 2011 5th International IEEE/EMBS Conference on
  • Conference_Location
    Cancun
  • ISSN
    1948-3546
  • Print_ISBN
    978-1-4244-4140-2
  • Type

    conf

  • DOI
    10.1109/NER.2011.5910643
  • Filename
    5910643