DocumentCode
1826191
Title
Measurement based compact thermal model creation - accurate approach to neglect inaccurate TIM conductivity data
Author
Vass-Varnai, Andras ; Bornoff, Robin ; Sarkany, Zoltan ; Ress, Sandor ; Rencz, Marta
Author_Institution
Mech. Anal. Div., Mentor Graphics Corp., Mentor, OH, USA
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
67
Lastpage
72
Abstract
In this paper two possible ways are investigated to create accurate thermal models without having validated information on the thermal properties of the applied thermal interface materials. One way is the calibration of a detailed numerical thermal model based on the physical information which can be derived from experimental structure functions. In the paper we show a complete calibration procedure using a TO-220 package as an example. Another approach is the generation of dynamic compact models based on real measurements. In order to apply this approach one has to identify the junction-to-case thermal resistance of the tested package using the JEDEC JESD 51-14 standard.
Keywords
packaging; thermal resistance; JEDEC JESD 51-14 standard; TO-220 package; dynamic compact models; inaccurate TIM conductivity data neglection; junction-to-case thermal resistance; measurement based compact thermal model creation; numerical thermal model; thermal interface materials; Electronic packaging thermal management; Heating; Numerical models; Semiconductor device measurement; Temperature measurement; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location
Singapore
Print_ISBN
978-1-4577-1983-7
Electronic_ISBN
978-1-4577-1981-3
Type
conf
DOI
10.1109/EPTC.2011.6184388
Filename
6184388
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