• DocumentCode
    1826191
  • Title

    Measurement based compact thermal model creation - accurate approach to neglect inaccurate TIM conductivity data

  • Author

    Vass-Varnai, Andras ; Bornoff, Robin ; Sarkany, Zoltan ; Ress, Sandor ; Rencz, Marta

  • Author_Institution
    Mech. Anal. Div., Mentor Graphics Corp., Mentor, OH, USA
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    67
  • Lastpage
    72
  • Abstract
    In this paper two possible ways are investigated to create accurate thermal models without having validated information on the thermal properties of the applied thermal interface materials. One way is the calibration of a detailed numerical thermal model based on the physical information which can be derived from experimental structure functions. In the paper we show a complete calibration procedure using a TO-220 package as an example. Another approach is the generation of dynamic compact models based on real measurements. In order to apply this approach one has to identify the junction-to-case thermal resistance of the tested package using the JEDEC JESD 51-14 standard.
  • Keywords
    packaging; thermal resistance; JEDEC JESD 51-14 standard; TO-220 package; dynamic compact models; inaccurate TIM conductivity data neglection; junction-to-case thermal resistance; measurement based compact thermal model creation; numerical thermal model; thermal interface materials; Electronic packaging thermal management; Heating; Numerical models; Semiconductor device measurement; Temperature measurement; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184388
  • Filename
    6184388