A new approach for PLL characterization on mixed signal ATE

Author

Kimura, Shinichi ; Kimura, Makoto ; Nakatani, Takayuki ; Sugai, Masao

Author_Institution

Advantest America, Inc., Ft. Lee, NJ, USA

fYear

1993

fDate

17-21 Oct 1993

Firstpage

697

Lastpage

704

Abstract

We have achieved a test technology for mixed signal ATE suitable for use in a production test environment for the characterization of the loop response and VCO sensitivity of PLL´s having response times of a few microseconds. This is a task that was previously not possible on mixed-signal ATE as it requires a Time Measurement Unit (TMU) utilizing a digital interpolator capable of making high speed “consecutive, instantaneous frequency measurements”

Keywords

automatic test equipment; automatic testing; frequency measurement; interpolation; phase locked loops; production testing; time measurement; voltage-controlled oscillators; PLL; VCO sensitivity; digital interpolator; instantaneous frequency measurements; loop response; mixed signal ATE; production test environment; Automatic testing; Filters; Frequency synchronization; Phase detection; Phase frequency detector; Phase locked loops; Signal processing; System testing; Transfer functions; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1993. Proceedings., International

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-1430-1

Type

conf

DOI

10.1109/TEST.1993.470633

Filename

470633

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1826200