DocumentCode
1826228
Title
FFT based troubleshooting of 120 dB dynamic range ADC systems
Author
Ownby, David ; Bogard, Harold
Author_Institution
Crystal Semicond. Corp., Austin, TX, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
690
Lastpage
696
Abstract
A production test solution for a family of monolithic 120 dB dynamic range delta-sigma ADCs demands strict adherence to system noise reduction techniques. Analysis of the FFT plot of an ADC output can help identify sources of noise in a system. This paper discusses several common causes of noise in delta-sigma based ADC systems and presents FFT plots showing the effect on the ADC output. Armed with the knowledge of how noise can creep into a delta-sigma based ADC system and a repertoire of typical signatures in the FFT plot, the system designer can diagnose and eliminate much of the noise
Keywords
analogue-digital conversion; fast Fourier transforms; fault diagnosis; integrated circuit testing; monolithic integrated circuits; production testing; sigma-delta modulation; 120 dB; ADC; FFT; clock jitter; delta-sigma; noise reduction; production test; signatures; troubleshooting; voltage reference; Bandwidth; Coupling circuits; Digital filters; Digital modulation; Dynamic range; Frequency; Noise reduction; Production systems; Semiconductor device noise; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470634
Filename
470634
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