Fault diagnosis of flash ADC using DNL test

Author

Charoenrook, Anchada ; Soma, Mani

Author_Institution

Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

fYear

1993

fDate

17-21 Oct 1993

Firstpage

680

Lastpage

689

Abstract

This paper describes a technique which uses the differential non linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash ADC, a fault in the analog subcircuit is uniquely reflected in the transfer function and therefore also in DNL data. This property is exploited to locate a fault and to identify the error value in analog components of the flash ADC. The technique proposed here relies only on DNL test data. Thus the diagnosis can be carried out using at-operating-speed test data. The paper presents relationship between each fault case and its respective DNL pattern. Fault simulation results of a small flash ADC are presented

Keywords

analogue-digital conversion; digital simulation; fault diagnosis; fault location; transfer functions; DNL test; analog components; at operating speed; differential nonlinearity test data; fault location; fault simulation; flash ADC; identification; transfer function; Circuit faults; Circuit testing; Coupling circuits; Digital circuits; Fault diagnosis; Fault location; Linearity; Prototypes; Signal design; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1993. Proceedings., International

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-1430-1

Type

conf

DOI

10.1109/TEST.1993.470635

Filename

470635