Title :
A general purpose IDDQ measurement circuit
Author :
Wallquist, Kenneth M. ; Righter, Alan W. ; Hawkins, Charles F.
Author_Institution :
Dept. of Electr. & Comput. Eng., New Mexico Univ., Albuquerque, NM, USA
Abstract :
A relatively high-speed IDDQ measurement circuit called QuiC-Mon is described. Depending upon IC settling times, upper measurement rates range from 50 kHz to 250 kHz at 100 nA resolution. It provides an inexpensive solution for fast, sensitive IDDQ measurements in CMOS IC wafer probe or packaged part production testing
Keywords :
CMOS integrated circuits; electric current measurement; integrated circuit testing; 100 muA; 50 kHz to 250 kHz; CMOS IC wafer probe; IC settling; QuiC-Mon; high-speed IDDQ measurement circuit; production testing; Capacitance measurement; Circuit testing; Current measurement; Current supplies; Frequency; Integrated circuit noise; Laboratories; Measurement techniques; Power supplies; Switches;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470639
