• DocumentCode
    1826298
  • Title

    A general purpose IDDQ measurement circuit

  • Author

    Wallquist, Kenneth M. ; Righter, Alan W. ; Hawkins, Charles F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Mexico Univ., Albuquerque, NM, USA
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    642
  • Lastpage
    651
  • Abstract
    A relatively high-speed IDDQ measurement circuit called QuiC-Mon is described. Depending upon IC settling times, upper measurement rates range from 50 kHz to 250 kHz at 100 nA resolution. It provides an inexpensive solution for fast, sensitive IDDQ measurements in CMOS IC wafer probe or packaged part production testing
  • Keywords
    CMOS integrated circuits; electric current measurement; integrated circuit testing; 100 muA; 50 kHz to 250 kHz; CMOS IC wafer probe; IC settling; QuiC-Mon; high-speed IDDQ measurement circuit; production testing; Capacitance measurement; Circuit testing; Current measurement; Current supplies; Frequency; Integrated circuit noise; Laboratories; Measurement techniques; Power supplies; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470639
  • Filename
    470639
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1826298