Title :
Quality and single-stuck faults
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
Abstract :
The goal of IC production test is to avoid selling bad parts. The goal of fault grading is to assure that the test is so thorough that only an acceptably small fraction of shipped parts are bad. Fault grading is almost always based on a single-stuck fault, ssf, model
Keywords :
integrated circuit testing; integrated logic circuits; logic testing; production testing; quality control; IC production test; fault grading; quality assurance; single-stuck faults; Circuit faults; Circuit testing; Delay; Fault detection; Integrated circuit interconnections; Integrated circuit testing; Inverters; Laboratories; Production; Test pattern generators;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470645
