Title :
Let´s grade all the faults
Author :
Maxwell, Peter C.
Author_Institution :
Hewlett-Packard Co., Santa Clara, CA, USA
Abstract :
The motivation for carrying out fault grading is to obtain a metric which expresses the effectiveness of a test in screening defective components. In terms of shipped parts, this effectiveness is reflected by the reject rate, or the proportion of parts which fail when used in their intended application. The most useful metric would be one which tracks the resultant quality level well, so that improving the metric would result in fewer shipped bad die, and a "perfect" score would result in zero reject rate
Keywords :
electronic equipment testing; failure analysis; fault diagnosis; fault location; integrated circuit testing; IDDQ testing; IC testing; defective components; effectiveness; electronic equipment testing; fault grading; reject rate; screening; shipped parts; zero reject rate; Delay; Electronic equipment testing; Fabrication; Failure analysis; Fault detection; Pins; Production; Timing; Voltage;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470647
