DocumentCode
1826505
Title
Practical considerations for mixed-signal test bus
Author
Lee, Nai-Chi
Author_Institution
Philips Electron. North America Corp., Briarcliff Manor, NY, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
591
Lastpage
592
Abstract
Mixed-signal test bus holds the promise to improve board-level testability, but it will also introduce various side-effects, possibly costing excessive overhead and even performance degradation. Some practical considerations on defining and applying such a test bus standard are presented
Keywords
IEEE standards; automatic testing; computer interfaces; economics; integrated circuit manufacture; integrated circuit testing; mixed analogue-digital integrated circuits; peripheral interfaces; printed circuit testing; production testing; standardisation; IEEE; PCB; board-level testability; mixed-signal test bus; overhead; performance degradation; side-effects; test bus standard; CMOS technology; Capacitance; Circuit testing; Costs; Coupling circuits; Impedance; Pins; Signal design; Switches; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470649
Filename
470649
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