DocumentCode
1826560
Title
Integrating electrical test into final assembly
Author
Littlebury, Hugh ; Brueckner, Roger
Author_Institution
Motorola Logic & Analog Technol. Group, Tempe, AZ, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
585
Lastpage
589
Abstract
This paper describes a set of projects that combine integrated circuit assembly steps. The completed set of projects will allow direct shipment of devices to customers from the end of the trim and form press. The integrated process steps include strip inspection, device mark, mark inspection, dambar removal, lead trim, final test, device form, device singulation, coplanarity inspection, reject sort and final package. The core change in assembly philosophy is to eliminate final test as a separate process step by performing the final test function earlier in the product flow
Keywords
electronic equipment testing; inspection; packaging; process control; production testing; coplanarity inspection; device mark; electrical test; final package; final test; integrated circuit assembly; lead trim; mark inspection; reject sort; singulation; strip inspection; Assembly; Circuit testing; Curing; Ink; Inspection; Integrated circuit packaging; Lead; Pins; Wafer bonding; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470651
Filename
470651
Link To Document