• DocumentCode
    1826918
  • Title

    The leak microstructure: a novel element for sensitive position two-dimensional read out gaseous detectors. Preliminary results

  • Author

    Lombardi, M. ; Lombardi, F.S.

  • Author_Institution
    Lab. Nazionali di Legnaro, Ist. Nazionale di Fisica Nucl., Legnaro, Italy
  • Volume
    1
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    603
  • Abstract
    A new microstructure for the detection of gas ionizing radiations has been characterized. For every-single detected ionizing radiation it gives a pair of “induced” charges of the same amount (pulses of the same amplitude), of opposite sign, with the same collection time and essentially in time coincidence, that are proportional to the primary ionization collected. Gas multiplication more than 105 with more than 108 electrons in the primary avalanches, working in the proportional region, are possible. The complete lack of insulating materials in the active volume of this microstructure avoids problems of charging-up and makes stable and repeatable its behaviour. This microstructure, through the use of the charge pair generated, allows the development of a position sensitive detector with a two-dimensional read-out. Using isobutane as the gas, an energy resolution of about 8% FWHM was recorded with α particles from an 241Am source in ΔE fashion. Always in isobutane gas, X-rays from a 55Fe source were also detected
  • Keywords
    X-ray detection; alpha-particle detection; position sensitive particle detectors; proportional counters; 241Am source; 55Fe source; Am; Fe; X-rays; alpha particles; energy resolution; gas ionizing radiations detection; gas multiplication; isobutane; leak microstructure; proportional region; sensitive position 2D read out gaseous detectors; Electrons; Energy resolution; Insulation; Ionization; Ionizing radiation; Iron; Microstructure; Position sensitive particle detectors; Radiation detectors; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591072
  • Filename
    591072