Title :
A flexible approach to data collection for component test systems
Author :
Mosley, Jim, III
Author_Institution :
Schlumberger Technol., San Jose, CA, USA
Abstract :
Yield improvements for VLSI devices require data collection and analysis during the manufacturing cycle. These data should be collected in a form that satisfies the needs of those performing different functions within the factory. This paper describes an approach to data collection that focuses on collecting test data in a format customized to the users needs. Though implemented on an advanced VLSI test system, key elements of this approach can be applied to any data collection domain
Keywords :
VLSI; automatic testing; data acquisition; graphical user interfaces; integrated circuit testing; GUI; VLSI devices; VLSI test; data collection; formatting; human interface; manufacturing cycle; modular design; Computer integrated manufacturing; Databases; Graphical user interfaces; Manufacturing processes; Packaging; Production facilities; Semiconductor device manufacture; Semiconductor device testing; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470665
