Title :
IEEE 1149 standards - Changing testing, silicon to systems
Author :
Tulloss, Rodham E.
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
Abstract :
After an introduction to IEEE standards development, the five active standards projects in the IEEE 1149 family are described briefly. Some just promulgated changes to ANSI/IEEE Std 1149.1 are presented. Among these changes are two new optional instructions intended to aid testing of product which require both in-circuit and boundary-scan testing and subordination of the 1149.1 Test Access Port to higher level test control. Updates on the status of IEEE P1149.2 and IEEE P1149.5 are presented
Keywords :
IEEE standards; automatic testing; boundary scan testing; design for testability; integrated circuit testing; production testing; ANSI/IEEE Std 1149.1; IEEE 1149 standards; IEEE P1149.2; IEEE P1149.5; active standards projects; boundary-scan testing; in-circuit testing; production testing; subordination; Digital signal processors; Digital systems; Manufacturing processes; Microprocessors; Proposals; Signal design; Silicon; Standardization; Standards development; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470672
