DocumentCode
1827211
Title
Improving predictability of wire-sweep in cavity filling analysis
Author
Subramanian, N.R. ; Teo Soon Tong ; Koh Liang Kng Ian ; Heinz, P.
Author_Institution
Infineon Technol. Asia Pacific Pte Ltd., Singapore, Singapore
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
272
Lastpage
276
Abstract
Microchip encapsulation processes involves complex tooling and molding intricacies that affect moldability and quality yield in transfer molding process of packages. Wire sweep during molding is a major concern to mold engineers as the wire deformation behaviour during encapsulation is difficult to realise and control. Hence, analyzing the effects of polymer flow around circuit wires can help to identify bonding regions that are susceptible to significant wire deformations and check for potential wire shorting. Currently commercially available molding process simulation programs are widely used for transfer molding simulation to determine the wire deformation; However, some correlation discrepancy issues with actual measurements have been observed. Correlations are also inconsistent and the accuracy is specific to package design, cavity position and runner/gate configuration in the melt feed layout. This paper presents an evaluation study on three-dimensional (3D) moldfilling analysis on a demonstrator package with alternative simulation programs to check the influence of meshing methodologies and on the accuracy of wire-sweep predictions compared with measured wire-sweep data.
Keywords
bonding processes; deformation; electronics packaging; encapsulation; moulding; polymers; wires (electric); bonding regions identification; cavity filling analysis; cavity position; complex tooling; correlation discrepancy; demonstrator package; meshing methodologies; microchip encapsulation process; molding intricacies; molding process simulation programs; package design; packages transfer molding process; polymer flow; potential wire shorting; runner-gate configuration; three-dimensional moldfilling analysis; transfer molding simulation; wire deformations; wire-sweep data measurement; wire-sweep predictability; Cavity resonators; Compounds; Filling; Resins; Solid modeling; Three dimensional displays; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location
Singapore
Print_ISBN
978-1-4577-1983-7
Electronic_ISBN
978-1-4577-1981-3
Type
conf
DOI
10.1109/EPTC.2011.6184430
Filename
6184430
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