DocumentCode :
1827226
Title :
SPICE-simulation of nonlinear effects in field-effect-transistors caused by thermal power feedback
Author :
Gottwald, Alexander
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1116
Lastpage :
1119
Keywords :
Circuit simulation; FETs; Fluctuations; Force feedback; Power dissipation; SPICE; Temperature dependence; Thermal engineering; Thermal force; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
692845
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1827226
