Title :
An ALU-based programmable MISR/pseudorandom generator for a MC68HC11 family self-test
Author :
Broseghini, James ; Lenhert, Donald H.
Author_Institution :
Motorola, Inc., Austin, TX, USA
Abstract :
This paper describes an ALU-based self-test system implemented on a MC68HC11 Family microcontroller. A fully programmable pseudorandom pattern generator and multiple input signature register are used to reduce test lengths and aliasing probabilities. Design constraints and goals are described along with a detailed description of an efficient method of using the ALU to implement the self-test functions. Systems usage and burn-in applications are also described
Keywords :
automatic test equipment; automatic testing; built-in self test; logic testing; microcontrollers; MC68HC11; aliasing probabilities; arithmetic logic unit; burn-in applications; microcontroller; multiple input signature register; programmable MISR/pseudorandom generator; pseudorandom pattern generator; self-test system; Built-in self-test; Central Processing Unit; Concurrent engineering; Microcontrollers; Microprocessors; Probes; Production; Registers; Silicon; Testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470678
