Control and observation of analog nodes in mixed-signal boards

Author

Matos, Jose S. ; Leão, Ana C. ; Ferreira, Joao C.

Author_Institution

INESC, Portugal

fYear

1993

fDate

17-21 Oct 1993

Firstpage

323

Lastpage

331

Abstract

BST is a well established standard and testability framework for digital ICs and boards. The paper presents a test support IC controlled by an IEEE1149.1 interface, capable of providing access to analog nodes in mixed-signal boards. The proposed architecture (ABSINT - Analog to Boundary Scan Interface) is described and relevant implementation issues are discussed. A demonstrator IC implementing the ABSINT architecture is presented, and it is shown how it can be used to provide analog test channels under control of IEEE1149.1

Keywords

IEEE standards; automatic test equipment; automatic testing; boundary scan testing; computer interfaces; mixed analogue-digital integrated circuits; peripheral interfaces; printed circuit testing; printed circuits; ABSINT; Analog to Boundary Scan Interface; IEEE1149.1; IEEE1149.1 interface; analog nodes; analog test channels; boards; digital ICs; mixed-signal boards; Analog integrated circuits; Binary search trees; Built-in self-test; Circuit testing; Consumer electronics; Digital signal processing; Electronic equipment testing; Integrated circuit testing; System testing; Telecommunication control;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1993. Proceedings., International

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-1430-1

Type

conf

DOI

10.1109/TEST.1993.470681

Filename

470681