Title :
Control and observation of analog nodes in mixed-signal boards
Author :
Matos, Jose S. ; Leão, Ana C. ; Ferreira, Joao C.
Author_Institution :
INESC, Portugal
Abstract :
BST is a well established standard and testability framework for digital ICs and boards. The paper presents a test support IC controlled by an IEEE1149.1 interface, capable of providing access to analog nodes in mixed-signal boards. The proposed architecture (ABSINT - Analog to Boundary Scan Interface) is described and relevant implementation issues are discussed. A demonstrator IC implementing the ABSINT architecture is presented, and it is shown how it can be used to provide analog test channels under control of IEEE1149.1
Keywords :
IEEE standards; automatic test equipment; automatic testing; boundary scan testing; computer interfaces; mixed analogue-digital integrated circuits; peripheral interfaces; printed circuit testing; printed circuits; ABSINT; Analog to Boundary Scan Interface; IEEE1149.1; IEEE1149.1 interface; analog nodes; analog test channels; boards; digital ICs; mixed-signal boards; Analog integrated circuits; Binary search trees; Built-in self-test; Circuit testing; Consumer electronics; Digital signal processing; Electronic equipment testing; Integrated circuit testing; System testing; Telecommunication control;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470681
